Microsphere‐Aided Super‐Resolution Scanning Spectral and Photocurrent Microscopy for Optoelectronic Devices.

MLA

Li, Yingjian, et al. “Microsphere‐Aided Super‐Resolution Scanning Spectral and Photocurrent Microscopy for Optoelectronic Devices.” Advanced Optical Materials, vol. 11, no. 16, Aug. 2023, pp. 1–10. EBSCOhost, https://doi.org/10.1002/adom.202300172.

APA

Li, Y., Qiu, C., Ji, H., Duan, S., Qin, F., Li, Z., Chen, P., Huang, J., Yu, G., & Yuan, H. (2023). Microsphere‐Aided Super‐Resolution Scanning Spectral and Photocurrent Microscopy for Optoelectronic Devices. Advanced Optical Materials, 11(16), 1–10. https://doi.org/10.1002/adom.202300172

Chicago

Li, Yingjian, Caiyu Qiu, Huajian Ji, Siyu Duan, Feng Qin, Zeya Li, Peng Chen, Junwei Huang, Geliang Yu, and Hongtao Yuan. 2023. “Microsphere‐Aided Super‐Resolution Scanning Spectral and Photocurrent Microscopy for Optoelectronic Devices.” Advanced Optical Materials 11 (16): 1–10. doi:10.1002/adom.202300172.