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A Highly Reliable Molybdenum Disulfide‐Based Synaptic Memristor Using a Copper Migration‐Controlled Structure.

Authors :
Ahn, Wonbae
Jeong, Han Beom
Oh, Jungyeop
Hong, Woonggi
Cha, Jun‐Hwe
Jeong, Hu Young
Choi, Sung‐Yool
Source :
Small; Aug2023, Vol. 19 Issue 33, p1-10, 10p
Publication Year :
2023

Details

Language :
English
ISSN :
16136810
Volume :
19
Issue :
33
Database :
Complementary Index
Journal :
Small
Publication Type :
Academic Journal
Accession number :
169971250
Full Text :
https://doi.org/10.1002/smll.202300223