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Development and applications of ultrafast transmission electron microscopy.

Authors :
Shimojima, T
Nakamura, A
Ishizaka, K
Source :
Microscopy; Aug2023, Vol. 72 Issue 4, p287-298, 12p
Publication Year :
2023

Details

Language :
English
ISSN :
20505698
Volume :
72
Issue :
4
Database :
Complementary Index
Journal :
Microscopy
Publication Type :
Academic Journal
Accession number :
169950474
Full Text :
https://doi.org/10.1093/jmicro/dfad021