Reconstruction of Closely Spaced Small Inclusions.

In this paper we establish an explicit asymptotic formula for the steady state voltage perturbations caused by closely spaced small conductivity inhomogeneities. Based on this new formula we design a very effective numerical method to identify the location and some geometric features of these inhomogeneities from a finite number of boundary measurements. The viability of our approach is documented by numerical examples. [ABSTRACT FROM AUTHOR]