Accurate and wide-range measurement of thermal conductivity of semiconductor materials by laser-excited Raman spectroscopy.

MLA

An, Ruihua, et al. “Accurate and Wide-Range Measurement of Thermal Conductivity of Semiconductor Materials by Laser-Excited Raman Spectroscopy.” Journal of Applied Physics, vol. 134, no. 1, July 2023, pp. 1–10. EBSCOhost, https://doi.org/10.1063/5.0152963.

APA

An, R., Zhao, J., Yang, J., Zhai, S., Dai, L., Wang, Q., Li, J., Hu, W., Sun, G., Fan, Y., Wu, S., & Niu, G. (2023). Accurate and wide-range measurement of thermal conductivity of semiconductor materials by laser-excited Raman spectroscopy. Journal of Applied Physics, 134(1), 1–10. https://doi.org/10.1063/5.0152963

Chicago

An, Ruihua, Jinyan Zhao, Jun Yang, Shijie Zhai, Liyan Dai, Qiang Wang, Jie Li, et al. 2023. “Accurate and Wide-Range Measurement of Thermal Conductivity of Semiconductor Materials by Laser-Excited Raman Spectroscopy.” Journal of Applied Physics 134 (1): 1–10. doi:10.1063/5.0152963.