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INTELLECTUAL PROPERTY THEFT IN OT ENVIRONMENTS: EXAMINING THE CYBER RISK TO MANUFACTURING PROCESSES.

Authors :
Hanrahan, Josh
Lacy, Seth
Source :
Process Technology; Jun2023, Vol. 37 Issue 1, p14-17, 4p
Publication Year :
2023

Details

Language :
English
Volume :
37
Issue :
1
Database :
Complementary Index
Journal :
Process Technology
Publication Type :
Periodical
Accession number :
164715524