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MoOx layer with abundant oxygen vacancies modified on Sn-doped α-Fe2O3 film for enhanced photoelectrochemical water oxidation performance.

Authors :
Pang, Tao
Guo, Peng
Xiao, Yequan
Li, Hongxing
Mo, Rong
Source :
Journal of Materials Science: Materials in Electronics; May2023, Vol. 34 Issue 13, p1-13, 13p
Publication Year :
2023

Abstract

The photoelectrochemical (PEC) water oxidation performance of α-Fe<subscript>2</subscript>O<subscript>3</subscript> photoanode can be improved by constructing proper heterojunction to promote photo-induced carrier separation and interfacial charge transfer. Here, an optimized MoO<subscript>x</subscript> layer with abundant oxygen vacancies was modified on Sn doped α-Fe<subscript>2</subscript>O<subscript>3</subscript> film by simple spin coating and thermal reduction method to form a heterojunction with enhanced PEC performance. XPS results suggest that increased oxygen vacancy concentration in MoO<subscript>x</subscript> layers can be achieved by post annealing the samples in N<subscript>2</subscript>. PEC tests of the prepared photoanodes revealed that the optimal N<subscript>2</subscript>-annealed MoO<subscript>x</subscript>/Sn-Fe<subscript>2</subscript>O<subscript>3</subscript> photoanode with abundant oxygen vacancies possesses the best photocurrent density (1.88 mA/cm<superscript>2</superscript> at 1.23 V vs RHE), which is up to 1.84 and 8.17 times compared with Sn-Fe<subscript>2</subscript>O<subscript>3</subscript> and pristine Fe<subscript>2</subscript>O<subscript>3</subscript>, respectively. The improved PEC performance can be attributed to the enhanced band bending and built-in electric field after increasing the oxygen vacancy concentration in MoO<subscript>x</subscript>, which promoted the carrier separation and transfer. This work demonstrates that constructing heterojunction using a MoO<subscript>x</subscript> layer with abundant oxygen vacancies is an effective approach to enhance the PEC performance of α-Fe<subscript>2</subscript>O<subscript>3</subscript> photoanode. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
09574522
Volume :
34
Issue :
13
Database :
Complementary Index
Journal :
Journal of Materials Science: Materials in Electronics
Publication Type :
Academic Journal
Accession number :
163622795
Full Text :
https://doi.org/10.1007/s10854-023-10519-2