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Nb/a-Si/Nb Josephson junctions for high-density superconducting circuits.
- Source :
- Applied Physics Letters; 5/1/2023, Vol. 122 Issue 18, p1-8, 8p
- Publication Year :
- 2023
-
Abstract
- We present electrical characterization data of sputtered Nb/a-Si/Nb Josephson junctions (JJs) for high-speed and high-density superconducting circuits. Junctions were studied with critical current densities ( J c ) ranging from 0.01 to 3 mA/μm<superscript>2</superscript> at 4 K. For junctions deposited at room temperature and processed to a maximum temperature of 150 °C, the dependence of J c on barrier thickness d is exponential, J c ∝ exp (− d / d 0) , with d 0 constant over the entire range of J c values studied. Junctions were annealed at temperatures up to 300 °C to study changes in their electrical properties and possible compatibility with high temperature fabrication processes. Current–voltage characteristics, critical current uniformity, critical current modulation with in-plane magnetic field, and sub-gap resistance behavior of these junctions were measured at 4 K and demonstrate that the junction properties do not degrade with annealing. These data indicate that Nb/a-Si/Nb JJs are a potential candidate for higher speed and higher density superconducting circuits. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 122
- Issue :
- 18
- Database :
- Complementary Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 163561851
- Full Text :
- https://doi.org/10.1063/5.0148250