Graphene Defect Editing, Deposition, and Growth via E-Beam-Induced Organic Reactions in Aberration Corrected STEM.

Details

Language :

English

ISSN :

14319276

Database :

Complementary Index

Journal :

Microscopy & Microanalysis

Publication Type :

Academic Journal

Accession number :

163213080

Full Text :

https://doi.org/10.1017/S1431927618010450