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In-situ Atomic-Resolution Observations of Oxide-Reduction Induced Formation of Nano-Holes in Cu2O Thin Films.
- Source :
- Microscopy & Microanalysis; Aug2019 Supplement, p1816-1817, 2p
- Publication Year :
- 2019
Details
- Language :
- English
- ISSN :
- 14319276
- Database :
- Complementary Index
- Journal :
- Microscopy & Microanalysis
- Publication Type :
- Academic Journal
- Accession number :
- 163212991
- Full Text :
- https://doi.org/10.1017/S143192761800956X