Microwave response of Rare-Earth oxide (Y2O3) thin film in x-band.

The polymeric film of Y₂O₃ (1%) doped Poly-vinyl-Alcohol (PVA) were synthesized and were confirmed with X-ray diffraction technique. The microwave response of this sample was studied using a Vector Network Analyzer (VNA). Analysis of the various parameters such as dielectric constant, reflection coefficient, transmission coefficient, dielectric loss, and Quality factor, of the material wereundertaken. The response of the materials wasstudied in a range of frequencies varying from 9 GHz. To 11.5 GHz. These parameters show potential applications of the material for variousmicrowave applications in the X-Band. [ABSTRACT FROM AUTHOR]