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Surface Plasmon Resonance (SPR) Combined Technology: A Powerful Tool for Investigating Interface Phenomena.

Authors :
Chen, Tianyi
Xin, Jialin
Chang, Shwu Jen
Chen, Ching‐Jung
Liu, Jen‐Tsai
Source :
Advanced Materials Interfaces; 3/15/2023, Vol. 10 Issue 8, p1-34, 34p
Publication Year :
2023

Abstract

Interface phenomena refer to the phenomena caused by various physical and chemical processes occurring at phase interfaces. These phenomena can include adhesion, friction, lubrication, evaporation, condensation, adsorption, monolayer formation, and other phenomena and are applied in many fields, such as food, papermaking, rubber, material science, energy, and biomedicine. However, traditional detection equipment cannot meet the interface phenomena observation needs because the information detected by techniques such as electrochemistry, spectroscopy, chromatography, and mass spectrometry is limited, as are the sensitivity and minimum detection limit. Surface plasmon resonance (SPR) combined technology is a powerful tool for investigating interface phenomena. This paper reviews all combination technologies of SPR with various conventional detection systems, emphasizing the combination with electrochemistry, Raman spectroscopy, and mass spectrometry. These technologies can observe interface phenomena through SPR and provide redox, molecular structure, functional group change, and other information. Through this information, the reactions on the interface can be made clearer and more controllable, which plays an important role in practical detection. In the future, SPR combined technology will mainly develop toward signal enhancement, light source coupling mode, and sensor chip design, and SPR will be combined with various detection technologies to achieve real‐time in situ detection of interface phenomena. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
21967350
Volume :
10
Issue :
8
Database :
Complementary Index
Journal :
Advanced Materials Interfaces
Publication Type :
Academic Journal
Accession number :
162434722
Full Text :
https://doi.org/10.1002/admi.202202202