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Synthesis and optical characterizations of l-phenylalanine lithium sulphate (LPLS) semi-organic single crystal.

Authors :
Meena, M.
Ebinezer, B. Samuel
Manikandan, E.
Sundararajan, R. S.
Shalini, M.
Natarajan, R.
Source :
Journal of Materials Science: Materials in Electronics; Feb2023, Vol. 34 Issue 5, p1-14, 14p
Publication Year :
2023

Abstract

A slow evaporation procedure has been used to grow semi-organic single crystals of (LPLS) l-phenylalanine (C<subscript>9</subscript>H<subscript>11</subscript>NO<subscript>2</subscript>) lithium sulphate (Li<subscript>2</subscript>SO<subscript>4</subscript>). Researchers examined the various characterizations of LPLS using single-crystal XRD, FT-IR, FT-Raman, optical absorbance, transmittance, dielectrics, laser damage threshold, microhardness, photoluminescence, and NLO. Based on the X-ray diffraction experiment, it was discovered that the grown crystal exhibits a non-centrosymmetry and lattice parameters are a = 5.49 Å, b = 4.89 Å, and c = 8.20 Å and α = γ = 90° and β = 107.32° which leads to monoclinic system. UV–Visible–NIR spectra have a split absorbance curve, which is useful in the application of bandpass filters. Molecular vibration modes are determined by Infrared and Raman spectra. In the photoluminescence spectrum, the crystal emits violet and blue light. Different mechanical properties were analysed by the Vickers microhardness test. The material's dielectric characteristics have been explored. A sample with a low dielectric loss and a low dielectric constant at high frequencies suggests that it has excellent optical properties. SEM analysis was also performed on the LPLS crystal, revealing its surface morphology. To determine the chemical composition of crystals, energy-dispersive X-ray methods are used. Analysing the added dopants confirmed their presence of carbon, oxygen, and sulphate. Using a 532 nm Nd:YAG laser, the laser damage threshold was measured under single-shot mode. The Kurtz and Perry powder technique has been proven to have the NLO property. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
09574522
Volume :
34
Issue :
5
Database :
Complementary Index
Journal :
Journal of Materials Science: Materials in Electronics
Publication Type :
Academic Journal
Accession number :
161691536
Full Text :
https://doi.org/10.1007/s10854-023-09820-x