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The Study of Orbital Ordering with Resonant X-ray Scattering.

Authors :
Murakami, Youichi
Source :
Synchrotron Radiation News; Nov/Dec2004, Vol. 17 Issue 6, p22-27, 6p
Publication Year :
2004

Abstract

The article introduces the resonant X-ray scattering (RXS) as a technique to detect the orbital ordering of electrons. Magnetic ions in a highly symmetrical crystalline field may have an orbital degeneracy in the ground state. When the electrons partially occupy the degenerate states, it is defined as a system having orbital degrees of freedom. Further, the RXS can be applied to the detection of the orbital ordering in f-electron systems, that is, quadrupolar ordering. The much weaker coupling between the orbital degree of freedom and the lattice in 4f-electron systems makes them an ideal platform to study orbital interactions originating from electronic mechanisms.

Details

Language :
English
ISSN :
08940886
Volume :
17
Issue :
6
Database :
Complementary Index
Journal :
Synchrotron Radiation News
Publication Type :
Academic Journal
Accession number :
16110226
Full Text :
https://doi.org/10.1080/08940880408603121