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Non‐destructive thermal ageing evaluation of P(VDF‐HFP) film based on broadband dielectric response.

Authors :
Wang, Qian
Wu, Chao
Gao, Yanfeng
Liu, Shuming
Liu, Shuqi
Zuo, Zhou
Liang, Xidong
Source :
High Voltage; Dec2022, Vol. 7 Issue 6, p1123-1129, 7p
Publication Year :
2022

Details

Language :
English
ISSN :
23977264
Volume :
7
Issue :
6
Database :
Complementary Index
Journal :
High Voltage
Publication Type :
Academic Journal
Accession number :
160900106
Full Text :
https://doi.org/10.1049/hve2.12236