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Self-Shut-Off Pulsed Latches for Minimizing Sequencing Overhead.

Authors :
Park, Hyunho
Jeong, Hanwool
Source :
IEEE Transactions on Very Large Scale Integration (VLSI) Systems; Nov2022, Vol. 30 Issue 11, p1728-1738, 11p
Publication Year :
2022

Abstract

In this study, a self-shut-off pulsed latch (SSPL) is proposed as sequencing elements for reducing the hold time constraint. As SSPL captures the data input after the clock edge, the large setup-time problem that exists in the master–slave flip-flop (MSFF) is eliminated. In addition, the transparency windows are closed immediately after successfully capturing the data input (self-shut-off), and the proposed SSPL is devoid of the large hold-time problem existing in conventional pulsed latches. According to the 7-nm FinFET postlayout simulation results, the sequencing timing overheads improved by 40% and 36% in SSPL, in comparison with the conventional MSFF at $V_{\mathrm {DD}} =0.4$ and 1.0 V, respectively. Furthermore, the hold time reduced by 54% and 58% in SSPL and at $V_{\mathrm {DD}} =0.4$ and 1.0 V, respectively, in comparison with the conventional pulsed latch. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10638210
Volume :
30
Issue :
11
Database :
Complementary Index
Journal :
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Publication Type :
Academic Journal
Accession number :
160688019
Full Text :
https://doi.org/10.1109/TVLSI.2022.3184410