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Demonstration of Multiply-Accumulate Operation With 28 nm FeFET Crossbar Array.

Authors :
De, Sourav
Muller, Franz
Laleni, Nellie
Lederer, Maximilian
Raffel, Yannick
Mojumder, Shaown
Vardar, Alptekin
Abdulazhanov, Sukhrob
Ali, Tarek
Dunkel, Stefan
Beyer, Sven
Seidel, Konrad
Kampfe, Thomas
Source :
IEEE Electron Device Letters; Dec2022, Vol. 43 Issue 12, p2081-2084, 4p
Publication Year :
2022

Abstract

This letter reports a linear multiply-accumulate (MAC) operation conducted on a crossbar memory array based on 28nm high-k metal gate (HKMG) Complementary Metal Oxide Semiconductor (CMOS) and ferroelectric field effect transistor (FeFET). The fabrication is conducted at GlobalFoundries with their standard 28nm technology. The crossbar arrays show a 100% yield in MAC operation on a 300mm wafer. The arrays were divided into ${8}\times {8}$ segments. The FeFET crossbar arrays were fabricated with access transistors, current-limiter transistors and a current-mode analog-to-digital converter (ADC) on the same wafer. Finally, the data retention characteristics reveal excellent data retention characteristics up to ${5}\times {10} ^{{4}}$ seconds, which makes this memory array suitable for carrying out MAC operations in inference engine applications. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
07413106
Volume :
43
Issue :
12
Database :
Complementary Index
Journal :
IEEE Electron Device Letters
Publication Type :
Academic Journal
Accession number :
160687714
Full Text :
https://doi.org/10.1109/LED.2022.3216558