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Discrimination Between Eccentricity and Interturn Faults Using Current or Voltage-Reference Signature Analysis in Symmetrical Six-Phase Induction Machines.

Authors :
Yepes, Alejandro G.
Fonseca, Davide S. B.
Antunes, Hugo R. P.
Lopez, Oscar
Marques Cardoso, Antonio J.
Doval-Gandoy, Jesus
Source :
IEEE Aerospace & Electronic Systems; Feb2023, Vol. 38 Issue 2, p2421-2434, 14p
Publication Year :
2023

Abstract

Two common defects in induction machines (IMs) are eccentricity and interturn faults, which should be diagnosed to prevent performance degradation and further damage. A popular fault-detection approach is the current signature analysis (CSA), because of its simplicity and nonintrusiveness. Under closed-loop control, it is combined with analogous voltage-reference (VR) signature analysis (VRSA). However, by using these methods in three-phase IMs, it is difficult to discriminate between these faults, which cause similar symptoms. Multiphase machines provide remarkable advantages such as inherent tolerance to open-phase faults. Six-phase IMs are particularly attractive since they allow adopting three-phase converters. Among them, those with symmetrical spatial arrangement of the stator phases offer superior fault tolerance. Nonetheless, the distinction between eccentricity and interturn failures in these IMs has not been addressed so far. This article studies the discrimination between eccentricity and interturn faults in symmetrical six-phase (S6) IMs by CSA or VRSA. It is shown that, conversely to three-phase IMs and most other multiphase IMs, in S6 ones, these two types of failures can be easily distinguished: interturn faults considerably alter the currents or VRs in the so-called $\boldsymbol{x}$ - $\boldsymbol{y}$ plane, whereas eccentricity leads to current/voltage symptoms only in the $\boldsymbol{\alpha} _{\mathbf{1}}$ - $\boldsymbol{\beta} _{\mathbf{1}}$ plane. Experimental results confirm the theory. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
08858985
Volume :
38
Issue :
2
Database :
Complementary Index
Journal :
IEEE Aerospace & Electronic Systems
Publication Type :
Academic Journal
Accession number :
160686089
Full Text :
https://doi.org/10.1109/TPEL.2022.3206141