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Reconfigurable Large-Current and High-Voltage Test Bench for HVDC Circuit Breaker Verification.

Authors :
Krneta, Nikola
Hagiwara, Makoto
Source :
IEEE Aerospace & Electronic Systems; Jan2023, Vol. 38 Issue 1, p523-537, 15p
Publication Year :
2023

Abstract

This article presents a novel circuit configuration of a high-voltage direct current circuit breaker (HVdcCB) test bench that is based on a modified H-bridge modular multilevel cascaded converter (MMCC). The modified MMCC is composed of fewer H-bridge cells, and it can be reconfigured during operation to allow the proposed test bench to output large current or high voltage for the current breaking and dielectric withstand tests. Although simultaneous output of large current and high voltage is not possible, the maximum transient interrupt voltage (TIV) withstand test can be performed with reduced ratings. The controllable output allows generation of complex waveforms to simulate a wide range of fault conditions. Furthermore, the modified MMCC has some inherent safety features that can reduce the need for additional protective equipment in case of operational failure of the HVdcCB. In contrast, the conventional charged capacitor and inductor-based designs cannot generate arbitrary waveforms, are only suitable for current breaking tests, and require additional circuits to generate initial conditions for the HVdcCB. AC short-circuit generator-based designs offer one degree of freedom for control of the output waveforms and can sustain the maximum TIV withstand test. However, the ac output is unsuitable for the dielectric withstand test, and additional circuits are required to provide initial conditions for the HVdcCB. The proposed test bench circuit configuration is verified using a downscaled experimental test bench that consists of a total of nine H-bridge cells with an equivalent switching frequency of 92.5 kHz. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
08858985
Volume :
38
Issue :
1
Database :
Complementary Index
Journal :
IEEE Aerospace & Electronic Systems
Publication Type :
Academic Journal
Accession number :
160685991
Full Text :
https://doi.org/10.1109/TPEL.2022.3199883