Back to Search Start Over

A Versatile ±25-A Shunt-Based Current Sensor With ±0.25% Gain Error From −40 °C to 85 °C.

Authors :
Tang, Zhong
Zamparette, Roger
Furuta, Yoshikazu
Nezuka, Tomohiro
Makinwa, Kofi A. A.
Source :
IEEE Journal of Solid-State Circuits; Dec2022, Vol. 57 Issue 12, p3716-3725, 10p
Publication Year :
2022

Abstract

This article presents a versatile shunt-based current sensor for battery management applications. It digitizes the current-induced voltage drop across an external shunt resistor with the help of a 2nd-order delta-sigma ($\Delta \Sigma $) ADC, whose summing node is implemented as a low-noise capacitively coupled amplifier. To compensate for the shunt’s finite temperature coefficient (TC), the TC of the ADC on-chip voltage reference can be tuned. As a result, the sensor maintains high accuracy when used with low-cost high TC shunts, such as PCB traces, as well as with more expensive low TC shunts, such as metal-alloy resistors. Optimal gain flatness over temperature is achieved by a two-current room-temperature TC tuning scheme, which exploits the shunt’s self-heating at high current levels. Fabricated in a standard 0.18- $\mu \text{m}$ CMOS process, the current sensor occupies 0.36 mm2 and draws 265 $\mu \text{A}$ from a 1.8-V supply. Over the industrial temperature range (−40 °C to 85 °C) and a ±25-A current range, it achieves the state-of-the-art gain error (±0.25%) with both PCB (1.6 $\text{m}\Omega $) and metal-alloy (2 $\text{m}\Omega $) shunts. With these shunts, it achieves 5.3-mA/4.3-mA (rms) resolution in a 10-kHz bandwidth. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189200
Volume :
57
Issue :
12
Database :
Complementary Index
Journal :
IEEE Journal of Solid-State Circuits
Publication Type :
Academic Journal
Accession number :
160620822
Full Text :
https://doi.org/10.1109/JSSC.2022.3204520