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A 28-nm 6-GHz 2-bit Continuous-Time ΔΣ ADC With −101-dBc THD and 120-MHz Bandwidth Using Blind Digital DAC Error Correction.

Authors :
Bolatkale, Muhammed
Rutten, Robert
Brekelmans, Hans
Bajoria, Shagun
Gao, Yihan
Burdiek, Bernard
Breems, Lucien J.
Source :
IEEE Journal of Solid-State Circuits; Dec2022, Vol. 57 Issue 12, p3768-3780, 13p
Publication Year :
2022

Abstract

In this article, a 6-GHz, 2-bit, fourth-order continuous-time delta–sigma (CT $\Delta \Sigma $) analog-to-digital converter (ADC) fabricated in 28-nm CMOS is presented. It achieves −101- and −105-dBc total harmonic distortion (THD)/third-order inter-modulation (IM3) typically and 72.3-dB signal to noise and distortion ratio (SNDR) in 120-MHz bandwidth (BW). The ADC comprises four cascaded integrators with inverter-based amplifiers, an offset compensated 2-bit quantizer, and calibrated 2-bit feedback (FB) digital-to-analog converter (DAC). The DAC and quantizer employ blind digital calibration techniques enabling the wideband linearity performance. The ADC does not require any external test signal during calibration. The power dissipation of the modulator core, including demultiplexer, is 108.8 mW. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189200
Volume :
57
Issue :
12
Database :
Complementary Index
Journal :
IEEE Journal of Solid-State Circuits
Publication Type :
Academic Journal
Accession number :
160620821
Full Text :
https://doi.org/10.1109/JSSC.2022.3202977