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Concrete Bridge Crack Image Classification Using Histograms of Oriented Gradients, Uniform Local Binary Patterns, and Kernel Principal Component Analysis.
- Source :
- Electronics (2079-9292); Oct2022, Vol. 11 Issue 20, p3357-N.PAG, 11p
- Publication Year :
- 2022
-
Abstract
- Bridges deteriorate over time, which requires the continuous monitoring of their condition. There are many digital technologies for inspecting and monitoring bridges in real-time. In this context, computer vision has extensively studied cracks to automate their identification in concrete surfaces, overcoming the conventional manual methods that rely on human judgment. The general framework of vision-based techniques consists of feature extraction using different filters and descriptors and classifier training to perform the classification task. However, training can be time-consuming and computationally expensive, depending on the dimension of the features. To address this limitation, dimensionality reduction techniques are applied to extracted features, and a new feature subspace is generated. This work used histograms of oriented gradients (HOGs) and uniform local binary patterns (ULBPs) to extract features from a dataset containing over 3000 uncracked and cracked images covering different patterns of cracks and concrete surface representations. Nonlinear dimensionality reduction was performed using kernel principal component analysis (KPCA), and three machine learning classifiers were implemented to conduct the classification. The experimental results show that the classification scheme based on the support-vector machine (SVM) model and feature-level fusion of the HOG and ULBP features after KPCA application provided the best results as an accuracy of 99.26% was achieved by the proposed classification framework. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 20799292
- Volume :
- 11
- Issue :
- 20
- Database :
- Complementary Index
- Journal :
- Electronics (2079-9292)
- Publication Type :
- Academic Journal
- Accession number :
- 159913454
- Full Text :
- https://doi.org/10.3390/electronics11203357