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Resilience of monolayer MoS2 memtransistor under heavy ion irradiation.

Details

Language :
English
ISSN :
08842914
Volume :
37
Issue :
17
Database :
Complementary Index
Journal :
Journal of Materials Research
Publication Type :
Academic Journal
Accession number :
159731036
Full Text :
https://doi.org/10.1557/s43578-022-00642-x