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Advanced In Situ TEM Nanomechanical Testing Options with the PI-95.

Authors :
Bhowmick, Sanjit
Hintsala, Eric
Stauffer, Douglas
Source :
Microscopy & Microanalysis; 2022 Supplement, Vol. 28, p3174-3175, 2p
Publication Year :
2022

Details

Language :
English
ISSN :
14319276
Volume :
28
Database :
Complementary Index
Journal :
Microscopy & Microanalysis
Publication Type :
Academic Journal
Accession number :
159538874
Full Text :
https://doi.org/10.1017/S1431927622011783