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Performance of SOI O-Gate Nanowires from Cryogenic to High Temperatures.

Authors :
Antonio Pavanello, Marcelo
de Souza, Michelly
Source :
Journal of Integrated Circuits & Systems; 2022, Vol. 17 Issue 2, p1-8, 8p
Publication Year :
2022

Details

Language :
English
ISSN :
18071953
Volume :
17
Issue :
2
Database :
Complementary Index
Journal :
Journal of Integrated Circuits & Systems
Publication Type :
Academic Journal
Accession number :
159279117
Full Text :
https://doi.org/10.29292/jics.v17i2.621