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High Voltage Normally-Off p-GaN Gate HEMT with the Compatible High Threshold and Drain Current.

Authors :
Yu, Cheng
Wang, Fangzhou
He, Junxian
Zhang, Yujian
Sun, Ruize
Xu, Wenjun
Ding, Guojian
Feng, Qi
Wang, Xiaohui
Wang, Yang
He, Miao
Chen, Wanjun
Jia, Haiqiang
Chen, Hong
Source :
ECS Journal of Solid State Science & Technology; Aug2022, Vol. 11 Issue 8, p370-373, 4p
Publication Year :
2022

Details

Language :
English
ISSN :
21628769
Volume :
11
Issue :
8
Database :
Complementary Index
Journal :
ECS Journal of Solid State Science & Technology
Publication Type :
Academic Journal
Accession number :
159228115
Full Text :
https://doi.org/10.1149/2162-8777/ac8a71