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Improving Fault Tolerance and Reliability of Heterogeneous Multi-Agent IoT Systems Using Intelligence Transfer.
- Source :
- Electronics (2079-9292); Sep2022, Vol. 11 Issue 17, p2724, 38p
- Publication Year :
- 2022
-
Abstract
- Driven by the ever-growing diversity of software and hardware agents available on the market, Internet-of-Things (IoT) systems, functioning as heterogeneous multi-agent systems (MASs), are increasingly required to provide a level of reliability and fault tolerance. In this paper, we develop an approach to generalized quantifiable modeling of fault-tolerant and reliable MAS. We propose a novel software architectural model, the Intelligence Transfer Model (ITM), by which intelligence can be transferred between agents in a heterogeneous MAS. In the ITM, we propose a novel mechanism, the latent acceptable state, which enables it to achieve improved levels of fault tolerance and reliability in task-based redundancy systems, as used in the ITM, in comparison with existing agent-based redundancy approaches. We demonstrate these improvements through experimental testing of the ITM using an open-source candidate implementation of the model, developed in Python, and through an open-source simulator that tested the behavior of ITM-based MASs at scale. The results of these experiments demonstrated improvements in fault tolerance and reliability across all MAS configurations we tested. Fault tolerance was observed to improve by a factor of between 1.27 and 6.34 in comparison with the control group, depending on the ITM configuration tested. Similarly, reliability was observed to improve by a factor of between 1.00 and 4.73. Our proposed model has broad applicability to various IoT applications and generally in MASs that have fault tolerance or reliability requirements, such as in cloud computing and autonomous vehicles. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 20799292
- Volume :
- 11
- Issue :
- 17
- Database :
- Complementary Index
- Journal :
- Electronics (2079-9292)
- Publication Type :
- Academic Journal
- Accession number :
- 159006606
- Full Text :
- https://doi.org/10.3390/electronics11172724