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Conceptual density functional theory under pressure: Part I. XP-PCM method applied to atoms.

Authors :
Eeckhoudt, J.
Bettens, T.
Geerlings, P.
Cammi, R.
Chen, B.
Alonso, M.
De Proft, F.
Source :
Chemical Science; 8/28/2022, Vol. 13 Issue 32, p9329-9350, 22p
Publication Year :
2022

Details

Language :
English
ISSN :
20416520
Volume :
13
Issue :
32
Database :
Complementary Index
Journal :
Chemical Science
Publication Type :
Academic Journal
Accession number :
158598270
Full Text :
https://doi.org/10.1039/d2sc00641c