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Defect engineered blue photoluminescence in ZnO:Al/TiO2 heterostructures.

Authors :
Saini, C. P.
Bhowmick, S.
Barman, A.
Kumar, N.
Das, A.
Khan, S. A.
Claverie, A.
Kanjilal, D.
Mahato, R. N.
Singh, K.
Kanjilal, A.
Source :
Journal of Applied Physics; 8/14/2022, Vol. 132 Issue 6, p1-11, 11p
Publication Year :
2022

Abstract

Tailoring the blue photoluminescence (PL) in Al-doped ZnO (AZO)/TiO<subscript>2</subscript> heterostructures is demonstrated by a controlled induction of shallow defect centers by 50 keV Ar<superscript>+</superscript>-ions. This is established by a combination of temperature dependent PL and electron paramagnetic resonance spectroscopy. The dominant blue-violet PL in an as-grown sample comprises a near band-edge emission, along with a peak associated with a radiative recombination of the electrons in shallow donor levels (Zn interstitials) and the holes from the valence band. However, the evolution of an additional yellow-green PL band at a fluence of 1 × 10<superscript>15</superscript> ions/cm<superscript>2</superscript> is governed by deep donor levels, particularly ionized oxygen vacancies. Irradiation at 1 × 10<superscript>16</superscript> ions/cm<superscript>2</superscript> further leads to the formation of Zn vacancies (shallow acceptors) owing to the development of an O-rich surface. The structural modifications of these samples have been investigated by field-emission scanning electron microscopy , transmission electron microscopy, and Rutherford backscattering. While small micro-cracks are found at a fluence of 2 × 10<superscript>16</superscript> ions/cm<superscript>2</superscript>, the formation of graded layers is obtained at the highest fluence of 5 × 10<superscript>16</superscript> ions/cm<superscript>2</superscript> owing to ballistic intermixing and diffusion of the constituents. Detailed investigation suggests that a significant amount of Ti atoms is diffused in AZO by a complete deterioration of the AZO/TiO<subscript>2</subscript> matrix at the highest fluence. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
132
Issue :
6
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
158508458
Full Text :
https://doi.org/10.1063/5.0096116