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Frequency-Domain Models for Nonlinear Microwave Devices Based on Large-Signal Measurements.
- Source :
- Journal of Research of the National Institute of Standards & Technology; Jul-Aug2004, Vol. 109 Issue 4, p407-427, 21p, 18 Diagrams, 8 Charts, 4 Graphs
- Publication Year :
- 2004
-
Abstract
- In this paper, we introduce nonlinear large-signal scattering (S) parameters, a new type of frequency-domain mapping that relates incident and reflected signals. We present a general form of nonlinear large-signal S-parameters and show that they reduce to classic S-parameters in the absence of nonlinearities. Nonlinear large-signal impedance (Z) and admittance (D) parameters are also introduced, and equations relating the different representations are derived. We illustrate how nonlinear large-signal S-parameters can be used as a tool in the design process of a nonlinear circuit, specifically a single-diode 1 GHz frequency-doubler. For the case where a nonlinear model is not readily available, we developed a method of extracting nonlinear large-signal S-parameters obtained with artificial neural network models trained with multiple measurements made by a nonlinear vector network analyzer equipped with two sources. Finally, nonlinear large-signal S-parameters are compared to another form of nonlinear mapping, known as nonlinear scattering functions. The nonlinear large-signal S-parameters are shown to be more general. [ABSTRACT FROM AUTHOR]
- Subjects :
- ELECTRIC impedance
ELECTRICITY
MEASUREMENT
SCATTERING (Physics)
FREQUENCY standards
Subjects
Details
- Language :
- English
- ISSN :
- 1044677X
- Volume :
- 109
- Issue :
- 4
- Database :
- Complementary Index
- Journal :
- Journal of Research of the National Institute of Standards & Technology
- Publication Type :
- Academic Journal
- Accession number :
- 15719753
- Full Text :
- https://doi.org/10.6028/jres.109.029