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Defect-gradient-induced Rashba effect in van der Waals PtSe2 layers.

Authors :
Jo, Junhyeon
Kim, Jung Hwa
Kim, Choong H.
Lee, Jaebyeong
Choe, Daeseong
Oh, Inseon
Lee, Seunghyun
Lee, Zonghoon
Jin, Hosub
Yoo, Jung-Woo
Source :
Nature Communications; 5/19/2022, Vol. 13 Issue 1, p1-8, 8p
Publication Year :
2022

Abstract

Defect engineering is one of the key technologies in materials science, enriching the modern semiconductor industry and providing good test-beds for solid-state physics. While homogenous doping prevails in conventional defect engineering, various artificial defect distributions have been predicted to induce desired physical properties in host materials, especially associated with symmetry breakings. Here, we show layer-by-layer defect-gradients in two-dimensional PtSe<subscript>2</subscript> films developed by selective plasma treatments, which break spatial inversion symmetry and give rise to the Rashba effect. Scanning transmission electron microscopy analyses reveal that Se vacancies extend down to 7 nm from the surface and Se/Pt ratio exhibits linear variation along the layers. The Rashba effect induced by broken inversion symmetry is demonstrated through the observations of nonreciprocal transport behaviors and first-principles density functional theory calculations. Our methodology paves the way for functional defect engineering that entangles spin and momentum of itinerant electrons for emerging electronic applications. Materials with strong Rashba-type spin-orbit coupling hold promise for spintronic applications and the investigation of topological phases of matter. Here, the authors report a method to generate layer-by-layer defect gradients in a van der Waals material, inducing broken spatial inversion symmetry and Rashba effect in the engineered layers. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
20411723
Volume :
13
Issue :
1
Database :
Complementary Index
Journal :
Nature Communications
Publication Type :
Academic Journal
Accession number :
156971944
Full Text :
https://doi.org/10.1038/s41467-022-30414-4