Comments by the Editors.

The 4th International Conference on Radiation Effects of Electronic Devices (ICREED) was held on May 26–29, 2021, in Xi’an, China. The conference was held in-person and well attended. In addition, several virtual presentations were given by authors who were unable to attend due to the ongoing worldwide pandemic. Ten papers presented at ICREED are included in the May 2022 issue of the IEEE Transactions on Nuclear Science (TNS). Many of these papers highlight active research on radiation effects on microelectronics in China. Additional papers based on work presented at ICREED may appear in other issues of the Transactions. [ABSTRACT FROM AUTHOR]