Total-Ionizing-Dose Response of SiGe HBTs at Elevated Temperatures.

MLA

Nergui, Delgermaa, et al. “Total-Ionizing-Dose Response of SiGe HBTs at Elevated Temperatures.” IEEE Transactions on Nuclear Science, vol. 69, no. 5, May 2022, pp. 1079–84. EBSCOhost, https://doi.org/10.1109/TNS.2022.3164327.

APA

Nergui, D., Teng, J. W., Hosseinzadeh, M., Mensah, Y., Li, K., Gorchichko, M., Ildefonso, A., Ringel, B. L., Zhang, E. X., Fleetwood, D. M., & Cressler, J. D. (2022). Total-Ionizing-Dose Response of SiGe HBTs at Elevated Temperatures. IEEE Transactions on Nuclear Science, 69(5), 1079–1084. https://doi.org/10.1109/TNS.2022.3164327

Chicago

Nergui, Delgermaa, Jeffrey W. Teng, Mozghan Hosseinzadeh, Yaw Mensah, Kan Li, Mariia Gorchichko, Adrian Ildefonso, et al. 2022. “Total-Ionizing-Dose Response of SiGe HBTs at Elevated Temperatures.” IEEE Transactions on Nuclear Science 69 (5): 1079–84. doi:10.1109/TNS.2022.3164327.