Back to Search Start Over

Unsupervised Feature Learning Architecture With Multi-Clustering Integration RBM.

Authors :
Chu, Jielei
Wang, Hongjun
Liu, Jing
Gong, Zhiguo
Li, Tianrui
Source :
IEEE Transactions on Knowledge & Data Engineering; Jun2022, Vol. 34 Issue 6, p3002-3015, 14p
Publication Year :
2022

Abstract

In this paper, we present a novel unsupervised feature learning architecture, which consists of a multi-clustering integration module and a variant of RBM termed multi-clustering integration RBM (MIRBM). In the multi-clustering integration module, we apply three clusterers (K-means, affinity propagation and spectral clustering algorithms) to obtain three different clustering partitions (CPs) without any background knowledge or label. Then, an unanimous voting strategy is used to generate a local clustering partition (LCP). The novel MIRBM model is a core feature encoding part of the proposed unsupervised feature learning architecture. The novelty of it is that the LCP as an unsupervised guidance is integrated into one step contrastive divergence (${\mathtt{{CD}}}_{1}$ CD 1 ) learning to guide the distribution of the hidden layer features. For the instance in the same LCP cluster, the hidden and reconstructed hidden layer features of the MIRBM model in the proposed architecture tend to constrict together in the training process. Meanwhile, each LCP center tends to disperse from each other as much as possible in the hidden and reconstructed hidden layer during training. The experiments demonstrate that the proposed unsupervised feature learning architecture has more powerful feature representation and generalization capability than the state-of-the-art models for clustering tasks in the Microsoft Research Asia Multimedia (MSRA-MM)2.0 dataset. [ABSTRACT FROM AUTHOR]

Subjects

Subjects :
IMAGE reconstruction

Details

Language :
English
ISSN :
10414347
Volume :
34
Issue :
6
Database :
Complementary Index
Journal :
IEEE Transactions on Knowledge & Data Engineering
Publication Type :
Academic Journal
Accession number :
156653468
Full Text :
https://doi.org/10.1109/TKDE.2020.3015959