Experimental determination of the lateral resolution of surface electric potential measurements by Kelvin probe force microscopy using biased electrodes separated by a nanoscale gap and application to thin-film transistors.

Details

Language :

English

ISSN :

25160230

Volume :

4

Issue :

8

Database :

Complementary Index

Journal :

Nanoscale Advances

Publication Type :

Academic Journal

Accession number :

156423997

Full Text :

https://doi.org/10.1039/d1na00824b