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Spectroscopic analysis through thermoelastic optical coherence microscopy.

Authors :
Doug Deen, Aaron
Pfeiffer, Tom
van Beusekom, Heleen
Essers, Jeroen
van der Steen, Antonius F. W.
Huber, Robert
van Soest, Gijs
Wang, Tianshi
Source :
Proceedings of SPIE; 9/13/2021, Vol. 11924, p119240Y-119240Y-3, 1p
Publication Year :
2021

Details

Language :
English
ISSN :
0277786X
Volume :
11924
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
154544526
Full Text :
https://doi.org/10.1117/12.2616068