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Fully On-Chip MAC at 14 nm Enabled by Accurate Row-Wise Programming of PCM-Based Weights and Parallel Vector-Transport in Duration-Format.

Authors :
Narayanan, P.
Ambrogio, S.
Okazaki, A.
Hosokawa, K.
Tsai, H.
Nomura, A.
Yasuda, T.
Mackin, C.
Lewis, S. C.
Friz, A.
Ishii, M.
Kohda, Y.
Mori, H.
Spoon, K.
Khaddam-Aljameh, R.
Saulnier, N.
Bergendahl, M.
Demarest, J.
Brew, K. W.
Chan, V.
Source :
IEEE Transactions on Electron Devices; Dec2021, Vol. 68 Issue 12, p6629-6636, 8p
Publication Year :
2021

Abstract

Hardware acceleration of deep learning using analog non-volatile memory (NVM) requires large arrays with high device yield, high accuracy Multiply-ACcumulate (MAC) operations, and routing frameworks for implementing arbitrary deep neural network (DNN) topologies. In this article, we present a 14-nm test-chip for Analog AI inference—it contains multiple arrays of phase change memory (PCM)-devices, each array capable of storing 512 $\times $ 512 unique DNN weights and executing massively parallel MAC operations at the location of the data. DNN excitations are transported across the chip using a duration representation on a parallel and reconfigurable 2-D mesh. To accurately transfer inference models to the chip, we describe a closed-loop tuning (CLT) algorithm that programs the four PCM conductances in each weight, achieving <3% average weight-error. A row-wise programming scheme and associated circuitry allow us to execute CLT on up to 512 weights concurrently. We show that the test chip can achieve near-software-equivalent accuracy on two different DNNs. We demonstrate tile-to-tile transport with a fully-on-chip two-layer network for MNIST (accuracy degradation ~0.6%) and show resilience to error propagation across long sequences (up to 10 000 characters) with a recurrent long short-term memory (LSTM) network, implementing off-chip activation and vector-vector operations to generate recurrent inputs used in the next on- chip MAC. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189383
Volume :
68
Issue :
12
Database :
Complementary Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
153925725
Full Text :
https://doi.org/10.1109/TED.2021.3115993