Back to Search Start Over

Compact Modeling of the Switching Dynamics and Temperature Dependencies in TiO ₓ -Based Memristors—Part I: Behavioral Model.

Authors :
Vaidya, Dhirendra
Kothari, Shraddha
Abbey, Thomas
Khiat, Ali
Stathopoulos, Spyros
Michalas, Loukas
Serb, Alexantrou
Prodromakis, Themis
Source :
IEEE Transactions on Electron Devices; Oct2021, Vol. 68 Issue 10, p4877-4884, 8p
Publication Year :
2021

Abstract

Memristor is a promising device as a fundamental building block for future unconventional system architectures such as neuromorphic computing, reconfigurable logic, and multibit memories. Therefore, to facilitate circuit design using memristors, accurate and efficient models spanning a wide range of programming voltages and temperatures are required. In the first part of this series, we propose a behavioral model for temperature dependence of nonvolatile switching dynamics of TiOx memristors. We begin by describing pulsed resistance transients (PRTs) of the memristors and then we use a multistage methodology to establish bias and temperature dependence of the model parameters. The proposed model is then shown to accurately describe the PRT characteristics of Pt/TiOx/Au and Pt/TiOx/Pt memristors. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189383
Volume :
68
Issue :
10
Database :
Complementary Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
153710690
Full Text :
https://doi.org/10.1109/TED.2021.3101996