Evolution of defects and charge carrier transport mechanism in fluorine-doped tin oxide thin films upon thermal treatment.

MLA

Zhou, Yawei, et al. “Evolution of Defects and Charge Carrier Transport Mechanism in Fluorine-Doped Tin Oxide Thin Films upon Thermal Treatment.” Journal of Applied Physics, vol. 130, no. 13, Oct. 2021, pp. 1–7. EBSCOhost, https://doi.org/10.1063/5.0062931.

APA

Zhou, Y., Liu, Z., He, C., & Yin, C. (2021). Evolution of defects and charge carrier transport mechanism in fluorine-doped tin oxide thin films upon thermal treatment. Journal of Applied Physics, 130(13), 1–7. https://doi.org/10.1063/5.0062931

Chicago

Zhou, Yawei, Zhe Liu, Chunqing He, and Chongshan Yin. 2021. “Evolution of Defects and Charge Carrier Transport Mechanism in Fluorine-Doped Tin Oxide Thin Films upon Thermal Treatment.” Journal of Applied Physics 130 (13): 1–7. doi:10.1063/5.0062931.