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Double-filter high-resolution soft x-ray tomographic diagnostic for investigating electron acceleration in TS-6 reconnection merging experiments.

Authors :
Xiang, Junguang
Takeda, Shinjiro
Cai, Yunhan
Tanabe, Hiroshi
Cao, Qinghong
Tanaka, Haruaki
Ono, Yasushi
Source :
Review of Scientific Instruments; Aug2021, Vol. 92 Issue 8, p1-6, 6p
Publication Year :
2021

Abstract

An innovative tangential-view soft x-ray (SXR) tomographic imaging measurement was developed on the TS-6 spherical tokamak merging device as a key diagnostic for investigating the mechanism of electron acceleration. In order to measure SXR with different energy ranges, two micro-channel plates (MCPs) are, respectively, installed in two vacuum chambers, which are equipped with different filters. Especially designed lenses and fiber bundles serve as an optical system to transfer images from phosphor plates of MCPs to a high speed imaging system. This design also enables us to simultaneously measure two images appearing on phosphor plates of MCPs by just one high speed imaging system. The temporal and spatial resolution of this diagnostic can be up to 5 µs and 4 mm, respectively, at present. The tomographic method based on the Phillips–Tikhonov regularization is employed to reconstruct line-integrated images into the local emissivity of SXR, which reflects the spatial distribution of high-energy electrons. Owing to this diagnostic, we successfully measured SXR emitted from the downstream region of magnetic reconnection in TS-6 merging experiments for the first time. The energy range of SXR turned out to be higher than 100 eV but lower than 400 eV. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00346748
Volume :
92
Issue :
8
Database :
Complementary Index
Journal :
Review of Scientific Instruments
Publication Type :
Academic Journal
Accession number :
152213625
Full Text :
https://doi.org/10.1063/5.0058112