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P‐16.13: Process Improvement for solving issue of the SiOxNy peeling on glass.

Authors :
Peng, Xu
Zhong-zheng, Yang
Zong-jie, Guo
Ting, Zeng
Liu-Yue, Yin
Zhan-qi, Xu
Yong-fei, Li
He-ren, Gui
Yuan-cheng, Li
Meng-meng, Li
Source :
SID Symposium Digest of Technical Papers; Aug2021 Supplement S1, Vol. 52, p1106-1109, 4p
Publication Year :
2021

Abstract

Dual SiOxNy shadow elimination is a common film design used in integrated color display devices. This article studied the influence factor of SiOxNy adhesion on glass. Therefore, the issue adhesion SiOxNy on glass is particularly important. The factors of affecting adhesion mainly include the several points: glass and layer surface properties, glass surface treatment, and adding transition layer. In view of the above points, we made a of lot methods such as glass shelf life control, glass pickling treatment and SiO2 transition layer respectively. Through optimizing process improvement, the final issues ratio was down from 50% to 0.84%, and by adding the SiO2 transition we solve the issue permanently. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0097966X
Volume :
52
Database :
Complementary Index
Journal :
SID Symposium Digest of Technical Papers
Publication Type :
Academic Journal
Accession number :
152096137
Full Text :
https://doi.org/10.1002/sdtp.15388