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Engineering electronic structure of topological insulator Bi2Te3 thin films by highly uniform ripple arrays.

Authors :
Shao, Zhibin
Li, Shaojian
Bian, Qi
Cao, Yan
Sun, Haigen
Liu, Lijun
Gao, Jianzhi
Chen, Xiaorui
Li, Qing
Pan, Minghu
Source :
Journal of Physics D: Applied Physics; 10/21/2021, Vol. 54 Issue 42, p1-9, 9p
Publication Year :
2021

Abstract

'Wrinkle engineering', as an effective approach to modify the properties of materials without introducing additional chemical doping, has been widely used in a variety of two-dimensional materials, including graphene, phosphorene and transitional metal dichalcogenides, etc. One-dimensional wrinkle or ripple arrays, which breaks the crystalline symmetry of materials, may reformate the nontrivial band structure and greatly affect the electronic properties of topological materials. Until now, such method has been rarely applied experimentally in tuning topological materials. Here, we fabricate highly uniform ripple arrays directly in few-quintuple-layers (QL) Bi<subscript>2</subscript>Te<subscript>3</subscript> thin films on SrTiO<subscript>3</subscript> substrate realized by in-situ strained epitaxial growth, investigated by detailed low temperature scanning tunneling microscope/spectroscopy. Well-defined one-dimensional (1D) ripple structures induced by the interfacial strain from the lattice mismatch between the Bi<subscript>2</subscript>Te<subscript>3</subscript> films and the substrate has been observed. As the thickness of Bi<subscript>2</subscript>Te<subscript>3</subscript> thin films increases, the release of the strain leads to the reduction of the averaged corrugation height and the periodicity of ripple array. The dI/dV spectra and spatially resolved spectroscopic survey acquired on the epitaxial layers with different thicknesses, reveal that both the energy gap and the Fermi velocity of the Dirac surface states are greatly enhanced on thinner films. Dirac fermion velocity v<subscript>F</subscript> is estimated about 7.8 × 10<superscript>5</superscript> m s<superscript>−1</superscript> for 3 QL, which is greatly enhanced by compared with the bulk values (4.8 × 10<superscript>5</superscript> m s<superscript>−1</superscript>). An asymmetric dispersion behavior along different − directions is observed, highly related with the modulation of 1D corrugated ripples on the electronic structure. Moreover, an unconventional Bi (S4) termination mainly observed on thinner films shows a stress-related behavior, agreed with previous theoretical calculations. Our work proposes a promising route to fabricate a highly uniform ripple structure on nontrivial topological materials, which can effectively tune the electronic structure. Specially, it may have an immediate application for realizing a high-performance topological-based device with higher operating temperature and speed. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00223727
Volume :
54
Issue :
42
Database :
Complementary Index
Journal :
Journal of Physics D: Applied Physics
Publication Type :
Academic Journal
Accession number :
151914203
Full Text :
https://doi.org/10.1088/1361-6463/ac16a6