Back to Search
Start Over
Fast Grain Mapping with Sub-Nanometer Resolution Using 4D-STEM with Grain Classification by Principal Component Analysis and Non-Negative Matrix Factorization.
- Source :
- Microscopy & Microanalysis; Aug2021, Vol. 27 Issue 4, p794-803, 10p
- Publication Year :
- 2021
Details
- Language :
- English
- ISSN :
- 14319276
- Volume :
- 27
- Issue :
- 4
- Database :
- Complementary Index
- Journal :
- Microscopy & Microanalysis
- Publication Type :
- Academic Journal
- Accession number :
- 151803468
- Full Text :
- https://doi.org/10.1017/S1431927621011946