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Stamping Tool Conditions Diagnosis: A Deep Metric Learning Approach.

Authors :
Dzulfikri, Zaky
Su, Pin-Wei
Huang, Chih-Yung
Source :
Applied Sciences (2076-3417); Aug2021, Vol. 11 Issue 15, p6959, 16p
Publication Year :
2021

Abstract

Stamping processes remain crucial in manufacturing processes; therefore, diagnosing the condition of stamping tools is critical. One of the challenges in diagnosing stamping tool conditions is that traditionally, the tools need to be visually checked, and the production processes thus need to be halted. With the development of Industry 4.0, intelligent monitoring systems have been developed by using accelerometers and algorithms to diagnose the wear classification of stamping tools. Although several deep learning models such as the convolutional neural network (CNN), auto encoder (AE), and recurrent neural network (RNN) models have demonstrated promising results for classifying complex signals including accelerometer signals, the practicality of those methods are restricted due to the flexibility of adding new classes and low accuracy when faced to low numbers of samples per class. In this study, we applied deep metric learning (DML) methods to overcome these problems. DML involves extracting meaningful features using feature extraction modules to map inputs into embedding features. We compared the probability method, the contrastive method, and a triplet network to determine which method was most suitable for our case. The experimental results revealed that, compared with other models, a triplet network can be more effectively trained with limited training data. The triplet network demonstrated the best test results of the compared methods in the noised test data. Finally, when tested using unseen class, the triplet network and the probability method demonstrated similar results. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
20763417
Volume :
11
Issue :
15
Database :
Complementary Index
Journal :
Applied Sciences (2076-3417)
Publication Type :
Academic Journal
Accession number :
151785504
Full Text :
https://doi.org/10.3390/app11156959