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Deflectometry based on light-field imaging.

Authors :
Meguenani, A.
Tout, K.
Kohler, S.
Bazeille, S.
Chambard, J.-P.
Cudel, C.
Source :
Proceedings of SPIE; 5/6/2021, Vol. 11794, p1179408-1179408, 1p
Publication Year :
2021

Details

Language :
English
ISSN :
0277786X
Volume :
11794
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
151773627
Full Text :
https://doi.org/10.1117/12.2588988
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