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Isolation: Inexpensively separating cold data via garbage collection to improve the lifetime and performance of NAND flash SSDs.

Authors :
Zhou, Bin
Wan, Shenggang
Xie, Changsheng
Source :
Concurrency & Computation: Practice & Experience; 8/10/2021, Vol. 33 Issue 15, p1-14, 14p
Publication Year :
2021

Abstract

Summary: An effective way to mitigate the lifetime and performance problems of NAND flash SSDs induced by garbage collection is separating the cold data and hot data. However, all existing solutions do this separation from the viewpoint of the hot data and thus suffer from expensive cost on monitoring the update behaviors of workloads. Different from the conventional wisdom, we propose to do the separation from the viewpoint of the cold data, which is rooted on the following two dedicated observations. First, the data migrated by garbage collection demonstrate a cold property compared with the other data. Second, it is inexpensive to separate the former data from the latter data. In the proposed method, named Isolation, we inexpensively separate the cold data via garbage collection. More specifically, through writing the data migrated by garbage collection (cold data) to dedicated blocks and writing the other data (hot data) to other blocks, the separation is done naturally. To evaluate Isolation, we conduct extensive trace‐driven simulations under seven typical workloads. The simulation results demonstrate the effectiveness and efficiency of Isolation. In most cases, Isolation can reduce the number of erasures and average I/O response time up to 47.3% and 80.1%, respectively. Existing approaches integrated with Isolation can further reduce the number of erasures and average I/O response time up to 7.8%‐18.5% and 10.7%‐41.4%, respectively. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
15320626
Volume :
33
Issue :
15
Database :
Complementary Index
Journal :
Concurrency & Computation: Practice & Experience
Publication Type :
Academic Journal
Accession number :
151366280
Full Text :
https://doi.org/10.1002/cpe.5460