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Phase imaging dislocations using diffracted beam interferometry.

Authors :
Herring, Rodney
Source :
Microscopy; Jun2021, Vol. 70 Issue 3, p297-301, 5p
Publication Year :
2021

Abstract

A phase imaging method that measures the phase shift existing at a dislocation's core is described. The method uses the interference of two symmetrically diffracted beams on the optic axis by means of an electron biprism. Each diffracted beam carries half the phase of the dislocation core. When combined, the entire phase shift of the dislocation core is obtained. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
20505698
Volume :
70
Issue :
3
Database :
Complementary Index
Journal :
Microscopy
Publication Type :
Academic Journal
Accession number :
150776498
Full Text :
https://doi.org/10.1093/jmicro/dfaa066