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Phase imaging dislocations using diffracted beam interferometry.
- Source :
- Microscopy; Jun2021, Vol. 70 Issue 3, p297-301, 5p
- Publication Year :
- 2021
-
Abstract
- A phase imaging method that measures the phase shift existing at a dislocation's core is described. The method uses the interference of two symmetrically diffracted beams on the optic axis by means of an electron biprism. Each diffracted beam carries half the phase of the dislocation core. When combined, the entire phase shift of the dislocation core is obtained. [ABSTRACT FROM AUTHOR]
- Subjects :
- PHASE-shifting interferometry
ELECTRONS
INTERFEROMETRY
Subjects
Details
- Language :
- English
- ISSN :
- 20505698
- Volume :
- 70
- Issue :
- 3
- Database :
- Complementary Index
- Journal :
- Microscopy
- Publication Type :
- Academic Journal
- Accession number :
- 150776498
- Full Text :
- https://doi.org/10.1093/jmicro/dfaa066