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Non-destructive depth measurement using SEM signal intensity.

Authors :
Adan, Ofer
Robinson, John C.
Seo, Jong-Hyun
Lee, Changhwan
Lee, Byoungho
Doi, Ayumi
Yamauchi, Aoi
Bizen, Daisuke
Suzuki, Makoto
Source :
Proceedings of SPIE; 11/4/2020, Vol. 11611, p116112Q-116112Q-8, 1p
Publication Year :
2020

Details

Language :
English
ISSN :
0277786X
Volume :
11611
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
150091337
Full Text :
https://doi.org/10.1117/12.2583623