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Gaussian random field EUV stochastic models, their generalizations and lithographically meaningful stochastic metrics.

Authors :
Felix, Nelson M.
Lio, Anna
Latypov, Azat
Khaira, Gurdaman
Fenger, Germain
Wang, Shuling
Chew, Marko
Shang, Shumay
Source :
Proceedings of SPIE; 11/2/2020, Vol. 11609, p1160917-1160917, 1p
Publication Year :
2020

Details

Language :
English
ISSN :
0277786X
Volume :
11609
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
150091237
Full Text :
https://doi.org/10.1117/12.2583792