Strain Relaxation in Si1-xGex Thin Films on Si (100) Substrates: Modeling and Comparisons with Experiments.

Details

Language :

English

ISSN :

19464274

Volume :

875

Issue :

1

Database :

Complementary Index

Journal :

MRS Online Proceedings Library

Publication Type :

Conference

Accession number :

148451610

Full Text :

https://doi.org/10.1557/PROC-875-O4.21